Book of Donmon Teith

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that eng

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of mo

The primary thrust of very large scale integration (VLS!) is the miniaturization of devices to increase packing density, achieve higher speed, and consume lower

This practical book shows how an understanding of structure, thermodynamics, and electrical properties can explain some of the choices of materials used in micr

This practical book shows how an understanding of structure, thermodynamics, and electrical properties can explain some of the choices of materials used in micr