Book of Donmon Teith

This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and effici

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for