Book of Donmon Teith

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital gui

Contains concise coverage of the major analytical techniques, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectr

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m

This book covers the experimental and theoretical understanding of surface and thin film processes. It presents a unique description of surface processes in ads

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital gui