Book of Donmon Teith

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scatterin

This is the only handbook available on X-ray data. In a concise and informative manner, the most important data connected with the emission of characteristic X-

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. T

First Published in 2018. Routledge is an imprint of Taylor & Francis, an Informa company.