Book of Donmon Teith

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and v

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that s

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra