Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width

Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width
Author :
Publisher :
Total Pages : 190
Release :
ISBN-10 : OCLC:702222288
ISBN-13 :
Rating : 4/5 ( Downloads)

Book Synopsis Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width by : 陳建佑

Download or read book Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width written by 陳建佑 and published by . This book was released on 2010 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt:


Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width Related Books

Characteristics and Hot Carrier Reliability of N-type MOS Transistor with Difference Channel Width
Language: en
Pages: 190
Hot Carrier Design Considerations for MOS Devices and Circuits
Language: en
Pages: 345
Authors: Cheng Wang
Categories: Science
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

As device dimensions decrease, hot-carrier effects, which are due mainly to the presence of a high electric field inside the device, are becoming a major design
Characteristics and Hot Carrier Reliability in 40V N-type LDMOS Transistors
Language: en
Pages: 69
Authors: 郭育禎
Categories:
Type: BOOK - Published: 2009 - Publisher:

DOWNLOAD EBOOK

Hot-Carrier Effects in MOS Devices
Language: en
Pages: 329
Authors: Eiji Takeda
Categories: Juvenile Nonfiction
Type: BOOK - Published: 1995 - Publisher: Academic Press

DOWNLOAD EBOOK

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for o