Book of Donmon Teith

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performa

This volume is the first complete overview of VLSI design methods that use statistical techniques for dealing with the random phenomena that are inherent in all

Metal Oxide Semiconductor (MOS) transistors are the basic building block ofMOS integrated circuits (I C). Very Large Scale Integrated (VLSI) circuits using MOS

A reprint of the classic text, this book popularized compact modeling of electronic and semiconductor devices and components for college and graduate-school cla