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Language: en
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Pages: 228
Type: BOOK - Published: 2011-09-08 - Publisher: Springer Science & Business Media
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly
Language: en
Pages: 426
Pages: 426
Type: BOOK - Published: 2010 - Publisher:
Language: en
Pages: 266
Pages: 266
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increase
Language: en
Pages: 208
Pages: 208
Type: BOOK - Published: 2015 - Publisher:
The failure of devices due to timing-related defects is becoming increasingly prominent in the nanometer era, thereby causing quality and reliability concerns.
Language: en
Pages: 288
Pages: 288
Type: BOOK - Published: 2010-02-26 - Publisher: Springer Science & Business Media
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high te