Book of Donmon Teith

Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each

This volume contains the post-proceedings of the 8th Doctoral Workshop on Mathematical and Engineering Methods in Computer Science, MEMICS 2012, held in Znojmo,

Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applicatio

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there