The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors
| Author | : 王瑋傑 |
| Publisher | : |
| Total Pages | : 73 |
| Release | : 2007 |
| ISBN-10 | : OCLC:772988041 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors by : 王瑋傑
Download or read book The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors written by 王瑋傑 and published by . This book was released on 2007 with total page 73 pages. Available in PDF, EPUB and Kindle. Book excerpt:
