Thermal Effects in Deep Sub-micron VLSI Interconnects and Implications for Reliability and Performance
| Author | : Kaustav Banerjee |
| Publisher | : |
| Total Pages | : 524 |
| Release | : 1999 |
| ISBN-10 | : UCAL:C3441516 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Thermal Effects in Deep Sub-micron VLSI Interconnects and Implications for Reliability and Performance by : Kaustav Banerjee
Download or read book Thermal Effects in Deep Sub-micron VLSI Interconnects and Implications for Reliability and Performance written by Kaustav Banerjee and published by . This book was released on 1999 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt:
