Book of Donmon Teith

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-st

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-st

Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluct

iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how do

Welcome to the proceedings of PATMOS 2008, the 18th in a series of int- national workshops. PATMOS 2008 was organized by INESC-ID / IST - TU Lisbon, Portugal, w