Characteristics and Hot Carrier Reliability of N-channel Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistors with Different NDD Dosage
| Author | : 田昆玄 |
| Publisher | : |
| Total Pages | : 76 |
| Release | : 2006 |
| ISBN-10 | : OCLC:774950525 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Characteristics and Hot Carrier Reliability of N-channel Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistors with Different NDD Dosage by : 田昆玄
Download or read book Characteristics and Hot Carrier Reliability of N-channel Lateral Diffused Metal Oxide Semiconductor (LDMOS) Transistors with Different NDD Dosage written by 田昆玄 and published by . This book was released on 2006 with total page 76 pages. Available in PDF, EPUB and Kindle. Book excerpt:
