Hot-carrier Reliability Assessment in CMOS Digital Integrated Circuits
| Author | : Wenjie Jiang |
| Publisher | : |
| Total Pages | : 218 |
| Release | : 1998 |
| ISBN-10 | : OCLC:40336257 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Hot-carrier Reliability Assessment in CMOS Digital Integrated Circuits by : Wenjie Jiang
Download or read book Hot-carrier Reliability Assessment in CMOS Digital Integrated Circuits written by Wenjie Jiang and published by . This book was released on 1998 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt:
