Optical Characterization of Thin Solid Films

Optical Characterization of Thin Solid Films
Author :
Publisher : Springer
Total Pages : 462
Release :
ISBN-10 : 9783319753256
ISBN-13 : 3319753258
Rating : 4/5 (258 Downloads)

Book Synopsis Optical Characterization of Thin Solid Films by : Olaf Stenzel

Download or read book Optical Characterization of Thin Solid Films written by Olaf Stenzel and published by Springer. This book was released on 2018-03-09 with total page 462 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.


Optical Characterization of Thin Solid Films Related Books

Optical Characterization of Thin Solid Films
Language: en
Pages: 462
Authors: Olaf Stenzel
Categories: Science
Type: BOOK - Published: 2018-03-09 - Publisher: Springer

DOWNLOAD EBOOK

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various app
Optical Properties of Thin Solid Films
Language: en
Pages: 276
Authors: O. S. Heavens
Categories: Science
Type: BOOK - Published: 1991-01-01 - Publisher: Courier Corporation

DOWNLOAD EBOOK

Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 fi
Optical Characterization of Real Surfaces and Films
Language: en
Pages: 345
Authors: K. Vedam
Categories: Science
Type: BOOK - Published: 2013-10-22 - Publisher: Academic Press

DOWNLOAD EBOOK

This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, f
Spectroscopic Ellipsometry
Language: en
Pages: 388
Authors: Hiroyuki Fujiwara
Categories: Technology & Engineering
Type: BOOK - Published: 2007-09-27 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principle
Handbook of Optical Properties
Language: en
Pages: 378
Authors: Rolf E. Hummel
Categories: Science
Type: BOOK - Published: 1995-02-24 - Publisher: CRC Press

DOWNLOAD EBOOK

Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this su