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RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
Language: en
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Authors: Mueller, Daniel
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Type: BOOK - Published: 2018-11-22 - Publisher: KIT Scientific Publishing

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Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown
RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
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Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown
Concepts for Short Range Millimeter-wave Miniaturized Radar Systems with Built-in Self-Test
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Modeling Backscattering Behavior of Vulnerable Road Users Based on High-Resolution Radar Measurements
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During the evolvement of autonomous driving technology, obtaining reliable 3-D environmental information is an indispensable task in approaching safe driving. T
Intelligent Reflecting Surfaces in Wireless Communication Systems
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Accompanied with the development of the wireless communication technologies, the high data traffic is more necessary for civil and industrial applications than