The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors

The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors
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Total Pages : 73
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ISBN-10 : OCLC:772988041
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Book Synopsis The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors by : 王瑋傑

Download or read book The Effect of Device Dimension on Hot Carrier Reliability of N-type LDMOS Transistors written by 王瑋傑 and published by . This book was released on 2007 with total page 73 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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