X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography
| Author | : Richard B. Hoover |
| Publisher | : SPIE-International Society for Optical Engineering |
| Total Pages | : 608 |
| Release | : 1991 |
| ISBN-10 | : UOM:39015022025038 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography by : Richard B. Hoover
Download or read book X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography written by Richard B. Hoover and published by SPIE-International Society for Optical Engineering. This book was released on 1991 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt:
